Phase Offset and Time Delay Correction on Magnetic Resonance Spectroscopy Data

Technology #2007-100

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Researchers
Mark M. Bahn M.D., Ph.D.
Managed By
Barb J. Keller
Patent Protection
US Patent Pending
US Patent Pending

A mathematical method is described that is used to estimate the inherent phase offsets and timing differences between data acquisitions of raw data acquisitions from the Magnetic Resonance scanner during MR Spectroscopy. Knowledge of the phase offset and time delay of each data set allows the correction of the data so that each set reflects data collected at the same time points with the same phase offset. These data can then be directly combined. This results in improved signal-to-noise in the spectroscopy parameters that are estimated from these data.