High Frequency Differential Test Probe for Tight, Compound, Geometries

Technology #2006-245

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Researchers
Wayne H. Fjerstad
Managed By
Bruce R. Kline
Patent Protection
US Patent Pending
US Patent Pending
US Patent Pending

This differential test probe was designed to meet the requirements of an automated test system. It has features not found in commercially available test probes. The ruggedness, compliance of all test pins, and the versatility to test more than one signal/ground pattern makes it useful for the automated test system. The mounting of micro probing pins directly in the center of the signal coax improves the high frequency testing capability.